Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9739728 | Automatic defect detection and classification for high throughput electron channeling contrast imaging | Stephen W. Bedell, Renee T. Mo, John A. Ott, Devendra K. Sadana, Brent A. Wacaser | 2017-08-22 |
| 9741532 | Multi-beam electron microscope for electron channeling contrast imaging of semiconductor material | Stephen W. Bedell, John A. Ott, Devendra K. Sadana, Brent A. Wacaser | 2017-08-22 |