Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9780007 | LCR test circuit structure for detecting metal gate defect conditions | Xu Ouyang, Yunsheng Song, Tso-Hui Ting | 2017-10-03 |
| 9702930 | Semiconductor wafer probing system including pressure sensing and control unit | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Tso-Hui Ting, Ping-Chuan Wang | 2017-07-11 |
| 9559051 | Method for manufacturing in a semiconductor device a low resistance via without a bottom liner | Jang Sim, Junjing Bao, Zhigang Song, Yunsheng Song | 2017-01-31 |