Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9780007 | LCR test circuit structure for detecting metal gate defect conditions | Xu Ouyang, Yunsheng Song, Yongchun Xin | 2017-10-03 |
| 9702930 | Semiconductor wafer probing system including pressure sensing and control unit | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Ping-Chuan Wang, Yongchun Xin | 2017-07-11 |