Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9780007 | LCR test circuit structure for detecting metal gate defect conditions | Xu Ouyang, Tso-Hui Ting, Yongchun Xin | 2017-10-03 |
| 9559051 | Method for manufacturing in a semiconductor device a low resistance via without a bottom liner | Yongchun Xin, Jang Sim, Junjing Bao, Zhigang Song | 2017-01-31 |