Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 9780007 | LCR test circuit structure for detecting metal gate defect conditions | Yunsheng Song, Tso-Hui Ting, Yongchun Xin | 2017-10-03 | $10,070,000 |
| 9646900 | Programmable addressable test chip | Yongjun Zheng, Zheng Shi, Peiyong Zhang | 2017-05-09 |