Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9817058 | Addressable test circuit and test method for key parameters of transistors | Weiwei Pan | 2017-11-14 |
| 9646900 | Programmable addressable test chip | Xu Ouyang, Zheng Shi, Peiyong Zhang | 2017-05-09 |