Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9817058 | Addressable test circuit and test method for key parameters of transistors | Yongjun Zheng | 2017-11-14 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9817058 | Addressable test circuit and test method for key parameters of transistors | Yongjun Zheng | 2017-11-14 |