Issued Patents 2016
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9525049 | Method for fabricating fin field effect transistors | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih, Yi-Tang Lin | 2016-12-20 |
| 9515071 | Asymmetric source/drain depths | Cheng-Yi Peng, Yu-Lin Yang, Chia-Cheng Ho, Jung-Piao Chiu, Tsung-Lin Lee +2 more | 2016-12-06 |
| 9472672 | Eliminating fin mismatch using isolation last | Yi-Tang Lin, Chih-Yu Hsu, Clement Hsingjen Wann | 2016-10-18 |
| 9472550 | Adjusted fin width in integrated circuitry | Chien-Hsun Wang, Yi-Tang Lin | 2016-10-18 |
| 9437683 | Method and structure for FinFET device | Kuo-Cheng Ching, Ka-Hing Fung, Zhiqiang Wu | 2016-09-06 |
| 9406697 | Semiconductor devices and manufacturing methods thereof | Chee-Wee Liu, Hung-Chih Chang, Cheng-Yi Peng | 2016-08-02 |
| 9391078 | Method and structure for finFET devices | CheeWee Liu, Wen-Hsien Tu, Shih-Hsien Huang, Cheng-Yi Peng, Yee-Chia Yeo | 2016-07-12 |
| 9379217 | FinFETs and the methods for forming the same | Chia-Cheng Ho, Tzu-Chiang Chen, Yi-Tang Lin | 2016-06-28 |
| 9368594 | Method of forming a fin-like BJT | Yi-Tang Lin, Ming-Feng Shieh | 2016-06-14 |
| 9355848 | Semiconductor structure and method for forming the same | Wei-Chih Chen, Chung-Hsien Tsai, Tung-Ming Chen, Jun-Chi Huang, Chih-Jen Lin +1 more | 2016-05-31 |
| 9269641 | Monitor test key of epi profile | Chia-Cheng Ho, Yi-Tang Lin | 2016-02-23 |
| 9257343 | Method for fabricating fin field effect transistors | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih, Yi-Tang Lin | 2016-02-09 |
| 9245805 | Germanium FinFETs with metal gates and stressors | Chih Chieh Yeh, Clement Hsingjen Wann | 2016-01-26 |
| 9236253 | Strained structure of a semiconductor device | Chung-Hsien Chen, Ting-Chu Ko, Chih-Hao Chang, Shou-Zen Chang, Clement Hsingjen Wann | 2016-01-12 |