Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9460886 | High resolution high quantum efficiency electron bombarded CCD or CMOS imaging sensor | Ximan Jiang, John Fielden | 2016-10-04 |
| 9404873 | Wafer inspection with multi-spot illumination and multiple channels | Mehdi Vaez-Iravani | 2016-08-02 |
| 9355440 | Detection of selected defects in relatively noisy inspection data | Haiguang Chen, Michael D. Kirk, Jaydeep Sinha | 2016-05-31 |
| 9279774 | Wafer inspection | Anatoly Romanovsky, Ivan Maleev, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll +2 more | 2016-03-08 |