Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9494531 | Multi-spot illumination for improved detection sensitivity | Yung-Ho Alex Chuang, Xiaoxu Lu, John Fielden | 2016-11-15 |
| 9377416 | Wafer edge detection and inspection | Venkata Raghavaiah Chowdhary Kode | 2016-06-28 |
| 9279774 | Wafer inspection | Anatoly Romanovsky, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll, Stephen Biellak +2 more | 2016-03-08 |