Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9401016 | Using high resolution full die image data for inspection | — | 2016-07-26 |
| 9360863 | Data perturbation for wafer inspection or metrology setup using a model of a difference | Govind Thattaisundaram, Mohan Mahadevan, Ajay Gupta, Chien-Huei Chen, Jason Kirkwood +2 more | 2016-06-07 |
| 9355208 | Detecting defects on a wafer | Eugene Shifrin, Kris Bhaskar, Graham Michael Lynch, John R. Jordan, Chwen-Jiann Fang | 2016-05-31 |
| 9262821 | Inspection recipe setup from reference image variation | Eugene Shifrin, Chetana Bhaskar, Chien-Huei Chen, Kris Bhaskar, Brian Duffy | 2016-02-16 |