Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9355208 | Detecting defects on a wafer | Ashok Kulkarni, Kris Bhaskar, Graham Michael Lynch, John R. Jordan, Chwen-Jiann Fang | 2016-05-31 |
| 9262821 | Inspection recipe setup from reference image variation | Chetana Bhaskar, Ashok Kulkarni, Chien-Huei Chen, Kris Bhaskar, Brian Duffy | 2016-02-16 |