Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9489599 | Decision tree construction for automatic classification of defects on semiconductor wafers | Chris Maher, Patrick Huet, Tai-Kam Ng, John R. Jordan | 2016-11-08 |
| 9483819 | Contour-based array inspection of patterned defects | Ajay Gupta, Thanh Huy Ha, Jianwei Wang, Hedong Yang, Christopher Maher +1 more | 2016-11-01 |
| 9360863 | Data perturbation for wafer inspection or metrology setup using a model of a difference | Govind Thattaisundaram, Mohan Mahadevan, Ajay Gupta, Ashok Kulkarni, Jason Kirkwood +2 more | 2016-06-07 |
| 9262821 | Inspection recipe setup from reference image variation | Eugene Shifrin, Chetana Bhaskar, Ashok Kulkarni, Kris Bhaskar, Brian Duffy | 2016-02-16 |