Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9483819 | Contour-based array inspection of patterned defects | Chien-Huei Chen, Ajay Gupta, Jianwei Wang, Hedong Yang, Christopher Maher +1 more | 2016-11-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9483819 | Contour-based array inspection of patterned defects | Chien-Huei Chen, Ajay Gupta, Jianwei Wang, Hedong Yang, Christopher Maher +1 more | 2016-11-01 |