Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9360863 | Data perturbation for wafer inspection or metrology setup using a model of a difference | Govind Thattaisundaram, Ajay Gupta, Chien-Huei Chen, Ashok Kulkarni, Jason Kirkwood +2 more | 2016-06-07 |