Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9355208 | Detecting defects on a wafer | Eugene Shifrin, Ashok Kulkarni, Kris Bhaskar, Graham Michael Lynch, John R. Jordan | 2016-05-31 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9355208 | Detecting defects on a wafer | Eugene Shifrin, Ashok Kulkarni, Kris Bhaskar, Graham Michael Lynch, John R. Jordan | 2016-05-31 |