Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9355208 | Detecting defects on a wafer | Eugene Shifrin, Ashok Kulkarni, Kris Bhaskar, John R. Jordan, Chwen-Jiann Fang | 2016-05-31 |
| 9347862 | Setting up a wafer inspection process using programmed defects | — | 2016-05-24 |