Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2016-12-27 |
| 9383196 | System, method and computed readable medium for evaluating a parameter of a feature having nano-metric dimensions | Yuval Yahav | 2016-07-05 |
| 9297692 | System and method for inspecting a sample using landing lens | Yoram Uziel, Alon Litman, Ron Naftali, Juergen Frosien | 2016-03-29 |