Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Roman Kris, Itay Zauer, Ran Goldman, Olga Novak +3 more | 2016-12-27 |
| 9490101 | System and method for scanning an object | Yuval Gronau, Benzion Sender, Dror Shemesh, Ran Schleyen, Ofir Greenberg | 2016-11-08 |
| 9378923 | Three-dimensional mapping using scanning electron microscope images | Yakov Weinberg | 2016-06-28 |