RK

Roman Kris

Applied Materials: 1 patents #401 of 946Top 45%
Overall (2016): #248,105 of 481,213Top 55%
1
Patents 2016

Issued Patents 2016

Patent #TitleCo-InventorsDate
9530199 Technique for measuring overlay between layers of a multilayer structure Yakov Weinberg, Ishai Schwarzband, Itay Zauer, Ran Goldman, Olga Novak +3 more 2016-12-27