Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Olga Novak +3 more | 2016-12-27 |
RG
Ran Goldman
Overall (2016): #258,908 of 481,213Top 55%
1
Patents 2016