Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman, Olga Novak +3 more | 2016-12-27 |
| 9378923 | Three-dimensional mapping using scanning electron microscope images | Ishai Schwarzband | 2016-06-28 |