Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9470751 | Detecting open and short of conductors | Amir Shoham | 2016-10-18 |
| 9466462 | Inspection of regions of interest using an electron beam system | Benzion Sender | 2016-10-11 |
| 9448253 | Determining a state of a high aspect ratio hole using measurement results from an electrostatic measurement device | Konstantin Chirko | 2016-09-20 |
| 9366954 | Inspection of a lithographic mask that is protected by a pellicle | Nir Ben-David Dodzin, Albert Karabekov, Alex Goldenshtein | 2016-06-14 |
| 9297692 | System and method for inspecting a sample using landing lens | Yoram Uziel, Ofer Adan, Ron Naftali, Juergen Frosien | 2016-03-29 |