Issued Patents 2016
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9484438 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2016-11-01 |
| 9472643 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2016-10-18 |
| 9466692 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2016-10-11 |
| 9443953 | Sacrificial silicon germanium channel for inversion oxide thickness scaling with mitigated work function roll-off and improved negative bias temperature instability | Takashi Ando, Kevin K. Chan, Vijay Narayanan | 2016-09-13 |
| 9391164 | Method to improve reliability of replacement gate device | Takashi Ando, Kisik Choi, Vijay Narayanan | 2016-07-12 |
| 9349832 | Sacrificial silicon germanium channel for inversion oxide thickness scaling with mitigated work function roll-off and improved negative bias temperature instability | Takashi Ando, Kevin K. Chan, Vijay Narayanan | 2016-05-24 |
| 9299802 | Method to improve reliability of high-K metal gate stacks | Takashi Ando, Barry P. Linder, Vijay Narayanan | 2016-03-29 |
| 9275744 | Method of restoring a flash memory in an integrated circuit chip package by addition of heat and an electric field | Jeffrey P. Gambino, Adam J. McPadden, Gary A. Tressler | 2016-03-01 |