Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2016-12-27 |
SL
Shimon Levi — 1 Patent in 2016
Overall (2016): #229,927 of 481,213Top 50%
1
Patents 2016