Issued Patents 2011
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8051352 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Mark Kassab, Chen Wang | 2011-11-01 |
| 8046653 | Low power decompression of test cubes | Grzegorz Mrugalski, Dariusz Czysz, Jerzy Tyszer | 2011-10-25 |
| 8024387 | Method for synthesizing linear finite state machines | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2011-09-20 |
| 8015461 | Decompressors for low power decompression of test patterns | Grzegorz Mrugalski, Dariusz Czysz, Jerzy Tyszer | 2011-09-06 |
| 7987442 | Fault dictionaries for integrated circuit yield and quality analysis methods and systems | Gang Chen, Martin Keim, Nagesh Tamarapalli, Manish Sharma, Huaxing Tang | 2011-07-26 |
| 7984354 | Generating responses to patterns stimulating an electronic circuit with timing exception paths | Dhiraj Goswami, Kun-Han Tsai, Mark Kassab | 2011-07-19 |
| 7962820 | Fault diagnosis of compressed test responses | Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer, Chen Wang | 2011-06-14 |
| 7925465 | Low power scan testing techniques and apparatus | Xijiang Lin, Dariusz Czysz, Mark Kassab, Grzegorz Mrugalski, Jerzy Tyszer | 2011-04-12 |
| 7913137 | On-chip comparison and response collection tools and techniques | Nilanjan Mukherjee, Jerzy Tyszer | 2011-03-22 |
| 7900104 | Test pattern compression for an integrated circuit test environment | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2011-03-01 |
| 7890827 | Compressing test responses using a compactor | Jerzy Tyszer, Chen Wang, Grzegorz Mrugalski, Artur Pogiel | 2011-02-15 |
| 7877656 | Continuous application and decompression of test patterns to a circuit-under-test | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2011-01-25 |
| 7865792 | Test generation methods for reducing power dissipation and supply currents | Xijiang Lin | 2011-01-04 |
| 7865794 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2011-01-04 |