Issued Patents 2011
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8086923 | Accurately identifying failing scan bits in compression environments | Wu-Tung Cheng | 2011-12-27 |
| 8046653 | Low power decompression of test cubes | Janusz Rajski, Dariusz Czysz, Jerzy Tyszer | 2011-10-25 |
| 8015461 | Decompressors for low power decompression of test patterns | Janusz Rajski, Dariusz Czysz, Jerzy Tyszer | 2011-09-06 |
| 7962820 | Fault diagnosis of compressed test responses | Janusz Rajski, Artur Pogiel, Jerzy Tyszer, Chen Wang | 2011-06-14 |
| 7925465 | Low power scan testing techniques and apparatus | Xijiang Lin, Dariusz Czysz, Mark Kassab, Janusz Rajski, Jerzy Tyszer | 2011-04-12 |
| 7890827 | Compressing test responses using a compactor | Janusz Rajski, Jerzy Tyszer, Chen Wang, Artur Pogiel | 2011-02-15 |