Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8051352 | Timing-aware test generation and fault simulation | Kun-Han Tsai, Mark Kassab, Chen Wang, Janusz Rajski | 2011-11-01 |
| 7925465 | Low power scan testing techniques and apparatus | Dariusz Czysz, Mark Kassab, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer | 2011-04-12 |
| 7865792 | Test generation methods for reducing power dissipation and supply currents | Janusz Rajski | 2011-01-04 |