Issued Patents 2011
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8046653 | Low power decompression of test cubes | Janusz Rajski, Grzegorz Mrugalski, Dariusz Czysz | 2011-10-25 |
| 8024387 | Method for synthesizing linear finite state machines | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2011-09-20 |
| 8015461 | Decompressors for low power decompression of test patterns | Janusz Rajski, Grzegorz Mrugalski, Dariusz Czysz | 2011-09-06 |
| 7962820 | Fault diagnosis of compressed test responses | Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Chen Wang | 2011-06-14 |
| 7925465 | Low power scan testing techniques and apparatus | Xijiang Lin, Dariusz Czysz, Mark Kassab, Grzegorz Mrugalski, Janusz Rajski | 2011-04-12 |
| 7913137 | On-chip comparison and response collection tools and techniques | Nilanjan Mukherjee, Janusz Rajski | 2011-03-22 |
| 7900104 | Test pattern compression for an integrated circuit test environment | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2011-03-01 |
| 7890827 | Compressing test responses using a compactor | Janusz Rajski, Chen Wang, Grzegorz Mrugalski, Artur Pogiel | 2011-02-15 |
| 7877656 | Continuous application and decompression of test patterns to a circuit-under-test | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2011-01-25 |
| 7865794 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2011-01-04 |