Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7987442 | Fault dictionaries for integrated circuit yield and quality analysis methods and systems | Janusz Rajski, Gang Chen, Nagesh Tamarapalli, Manish Sharma, Huaxing Tang | 2011-07-26 |