CL

Christian Lavoie

IBM: 12 patents #150 of 9,568Top 2%
Globalfoundries: 1 patents #73 of 305Top 25%
📍 Pleasantville, NY: #1 of 23 inventorsTop 5%
🗺 New York: #76 of 10,473 inventorsTop 1%
Overall (2011): #2,435 of 364,097Top 1%
12
Patents 2011

Issued Patents 2011

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
8039382 Method for forming self-aligned metal silicide contacts Sunfei Fang, Randolph F. Knarr, Mahadevaiyer Krishnan, Renee T. Mo, Balasubramanian Pranatharthiharan +1 more 2011-10-18
8039331 Opto-thermal annealing methods for forming metal gate and fully silicided gate-field effect transistors Scott D. Allen, Cyril Cabral, Jr., Kevin K. Dezfulian, Sunfei Fang, Brian J. Greene +6 more 2011-10-18
8030154 Method for forming a protection layer over metal semiconductor contact and structure formed thereon Ahmet S. Ozcan, Zhen Zhang, Bin Yang 2011-10-04
8021971 Structure and method to form a thermally stable silicide in narrow dimension gate stacks Anthony G. Domenicucci, Ahmet S. Ozcan 2011-09-20
8003473 Bipolar transistor with silicided sub-collector Francois Pagette, Anna W. Topol 2011-08-23
8003453 Self-aligned process for nanotube/nanowire FETs Phaedon Avouris, Roy A. Carruthers, Jia Chen, Christopher G. M. M. Detavernier, Hon-Sum Philip Wong 2011-08-23
8003524 Plating seed layer including an oxygen/nitrogen transition region for barrier enhancement Chih-Chao Yang, Simon Gaudet, Shom Ponoth, Terry A. Spooner 2011-08-23
7993987 Surface cleaning using sacrificial getter layer Randolph F. Knarr, Ahmet S. Ozcan, Filippos Papadatos 2011-08-09
7932169 Interconnection for flip-chip using lead-free solders and having improved reaction barrier layers Luc Belanger, Stephen L. Buchwalter, Leena Paivikki Buchwalter, Ajay P. Giri, Jonathan H. Griffith +8 more 2011-04-26
7927895 Varying capacitance voltage contrast structures to determine defect resistance Conal E. Murray, Oliver D. Patterson, Robert L. Wisnieff 2011-04-19
7923838 Method and structure for reducing contact resistance between silicide contact and overlying metallization Conal E. Murray, Kenneth P. Rodbell 2011-04-12
7888264 MOSFET structure with multiple self-aligned silicide contacts Kevin K. Chan, Kern Rim 2011-02-15