Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7952700 | Method of apparatus for detecting particles on a specimen | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Sachio Uto, Hiroyuki Nakano +5 more | 2011-05-31 |
| 7881520 | Defect inspection system | Yasuhiro Yoshitake | 2011-02-01 |