DH

David R. Hembree

Micron: 16 patents #25 of 861Top 3%
📍 Boise, ID: #12 of 564 inventorsTop 3%
🗺 Idaho: #14 of 1,002 inventorsTop 2%
Overall (2005): #294 of 245,428Top 1%
16
Patents 2005

Issued Patents 2005

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
6967307 Method and process of contact to a heat softened solder ball array Warren M. Farnworth 2005-11-22
6967497 Wafer processing apparatuses and electronic device workpiece processing apparatuses 2005-11-22
6954000 Semiconductor component with redistribution circuit having conductors and test contacts Jorge L. de Varona 2005-10-11
6939145 Spring element for use in an apparatus for attaching to a semiconductor and a method of making Salman Akram, Derek Gochnour 2005-09-06
6933524 Semiconductor component having test contacts Jorge L. de Varona 2005-08-23
6932077 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions and dicing apparatus Salman Akram, Derek Gochnour, Michael E. Hess 2005-08-23
6903443 Semiconductor component and interconnect having conductive members and contacts on opposing sides Warren M. Farnworth, Alan G. Wood 2005-06-07
6900459 Apparatus for automatically positioning electronic dice within component packages Warren M. Farnworth, Alan G. Wood, John O. Jacobson, James M. Wark, Jennifer L. Folaron +3 more 2005-05-31
6899797 Apparatus for continuous processing of semiconductor wafers Salman Akram 2005-05-31
6897571 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions Salman Akram, Derek Gochnour, Michael E. Hess 2005-05-24
6881974 Probe card for testing microelectronic components Alan G. Wood, Trung T. Doan 2005-04-19
6881274 Carrier for cleaning sockets for semiconductor components having contact balls 2005-04-19
6851597 Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems Michael E. Hess, John O. Jacobson, Warren M. Farnworth, Alan G. Wood 2005-02-08
6850084 Assembly for testing silicon wafers which have a through-via 2005-02-01
6841868 Memory modules including capacity for additional memory Salman Akram, James M. Wark 2005-01-11
6841883 Multi-dice chip scale semiconductor components and wafer level methods of fabrication Warren M. Farnworth, Alan G. Wood, William M. Hiatt, James M. Wark, Kyle K. Kirby +1 more 2005-01-11