Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943042 | Method of detecting spatially correlated variations in a parameter of an integrated circuit die | Robert Madge, Bruce Whitefield | 2005-09-13 |
| 6880140 | Method to selectively identify reliability risk die based on characteristics of local regions on the wafer | Ramon Gonzales, Manu Rehani, David Abercrombie | 2005-04-12 |