Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6880140 | Method to selectively identify reliability risk die based on characteristics of local regions on the wafer | Kevin Cota, Manu Rehani, David Abercrombie | 2005-04-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6880140 | Method to selectively identify reliability risk die based on characteristics of local regions on the wafer | Kevin Cota, Manu Rehani, David Abercrombie | 2005-04-12 |