Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6980917 | Optimization of die yield in a silicon wafer “sweet spot” | Mark Ward, Larry Kelley | 2005-12-27 |
| 6880140 | Method to selectively identify reliability risk die based on characteristics of local regions on the wafer | Ramon Gonzales, Kevin Cota, Manu Rehani | 2005-04-12 |