Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943042 | Method of detecting spatially correlated variations in a parameter of an integrated circuit die | Kevin Cota, Bruce Whitefield | 2005-09-13 |
| 6931297 | Feature targeted inspection | — | 2005-08-16 |