Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6921672 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, Gustavo A. Pinto, David L. Adler, Robert Long, Neil Richardson +2 more | 2005-07-26 |
| 6861666 | Apparatus and methods for determining and localization of failures in test structures using voltage contrast | Gaurav Verma, Peter Nunan, Indranil De | 2005-03-01 |
| 6855568 | Apparatus and methods for monitoring self-aligned contact arrays using voltage contrast inspection | Peter Nunan, Sanjay Tandon | 2005-02-15 |