Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6921672 | Test structures and methods for inspection of semiconductor integrated circuits | Akella V. S. Satya, David L. Adler, Robert Long, Neil Richardson, Kurt H. Weiner +2 more | 2005-07-26 |
| 6867606 | Multiple directional scans of test structures on semiconductor integrated circuits | Brian C. Leslie, David L. Adler, Akella V. S. Satya, Robert Long, David J. Walker | 2005-03-15 |