Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6948141 | Apparatus and methods for determining critical area of semiconductor design data | Vladimir Federov, Li Song | 2005-09-20 |
| 6921672 | Test structures and methods for inspection of semiconductor integrated circuits | Gustavo A. Pinto, David L. Adler, Robert Long, Neil Richardson, Kurt H. Weiner +2 more | 2005-07-26 |
| 6918101 | Apparatus and methods for determining critical area of semiconductor design data | Raman K. Nurani, Li Song | 2005-07-12 |
| 6867606 | Multiple directional scans of test structures on semiconductor integrated circuits | Gustavo A. Pinto, Brian C. Leslie, David L. Adler, Robert Long, David J. Walker | 2005-03-15 |