Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6946064 | Sample mount for performing sputter-deposition in a focused ion beam (FIB) tool | Lawrence Fischer, Chad Rue | 2005-09-20 |
| 6900137 | Dry etch process to edit copper lines | Ville S. Kiiskinen, Chad Rue, Carmelo F. Scrudato, Michael Sievers | 2005-05-31 |
| 6858530 | Method for electrically characterizing charge sensitive semiconductor devices | Terence L. Kane, Lawrence Fischer, Ying Hong, Michael P. Tenney | 2005-02-22 |
| 6843893 | Metal dry etch using electronic field | Herschel M. Marchman, Chad Rue, Michael Sievers | 2005-01-18 |