Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6946064 | Sample mount for performing sputter-deposition in a focused ion beam (FIB) tool | Steven B. Herschbein, Chad Rue | 2005-09-20 |
| 6858530 | Method for electrically characterizing charge sensitive semiconductor devices | Terence L. Kane, Steven B. Herschbein, Ying Hong, Michael P. Tenney | 2005-02-22 |