Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975391 | Method and apparatus for non-destructive testing | Toshio Asano, Tetsuo Taguchi, Isao Tanaka | 2005-12-13 |
| 6950545 | Nondestructive inspection method and apparatus | Mineo Nomoto, Daiske Katsuta, Toshio Asano, Tetsuo Taguchi, Isao Tanaka | 2005-09-27 |
| 6927847 | Method and apparatus for inspecting pattern defects | Minoru Yoshida, Shunji Maeda, Atsushi Shimoda, Takafumi Okabe | 2005-08-09 |
| 6900888 | Method and apparatus for inspecting a pattern formed on a substrate | Minoru Yoshida, Shunji Maeda, Atsushi Shimoda, Takafumi Okabe, Masahiro Watanabe | 2005-05-31 |
| 6879392 | Method and apparatus for inspecting defects | Shunji Maeda, Takafumi Okabe, Masahiro Watanabe | 2005-04-12 |