Issued Patents 2005
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6969678 | Multi-silicide in integrated circuit technology | Robert J. Chiu, Paul R. Besser, Jeffrey P. Patton, Austin Frenkel, Thorsten Kammler +1 more | 2005-11-29 |
| 6967160 | Method of manufacturing semiconductor device having nickel silicide with reduced interface roughness | Eric N. Paton, Paul R. Besser, Fred N. Hause | 2005-11-22 |
| 6964875 | Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance | William G. En, Mark W. Michael, Hai Hong Wang | 2005-11-15 |
| 6873051 | Nickel silicide with reduced interface roughness | Eric N. Paton, Paul R. Besser, Fred N. Hause | 2005-03-29 |
| 6867130 | Enhanced silicidation of polysilicon gate electrodes | Olov Karlsson, William G. En, Mark W. Michael | 2005-03-15 |
| 6841832 | Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance | William G. En, Mark W. Michael, Hai Hong Wang | 2005-01-11 |