Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6964875 | Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance | William G. En, Mark W. Michael, Simon S. Chan | 2005-11-15 |
| 6841832 | Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance | William G. En, Mark W. Michael, Simon S. Chan | 2005-01-11 |