Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791345 | Contactor for testing semiconductor device and manufacturing method thereof | Shigeyuki Maruyama, Kazuhiro Tashiro, Naoyuki Watanabe, Takafumi Hashitani, Ei Yano | 2004-09-14 |
| 6774650 | Probe card and method of testing wafer having a plurality of semiconductor devices | Shigeyuki Maruyama, Naoyuki Watanabe, Yoshito Konno, Eiji Yoshida, Toshiyuki Honda +2 more | 2004-08-10 |