Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791345 | Contactor for testing semiconductor device and manufacturing method thereof | Shigeyuki Maruyama, Naoyuki Watanabe, Daisuke Koizumi, Takafumi Hashitani, Ei Yano | 2004-09-14 |
| 6767219 | Contactor, method for manufacturing such contactor, and testing method using such contactor | Shigeyuki Maruyama, Naoyuki Watanabe, Naohito Kohashi, Osamu Igawa, Tetsuya Fujisawa | 2004-07-27 |