Issued Patents 2004
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6806723 | Contactor having contact electrodes formed by laser processing | Shigeyuki Maruyama, Keisuke Fukuda, Takumi Kumatabara, Naohisa Matsushita, Masayuki Imakado +2 more | 2004-10-19 |
| 6791345 | Contactor for testing semiconductor device and manufacturing method thereof | Shigeyuki Maruyama, Kazuhiro Tashiro, Daisuke Koizumi, Takafumi Hashitani, Ei Yano | 2004-09-14 |
| 6774650 | Probe card and method of testing wafer having a plurality of semiconductor devices | Shigeyuki Maruyama, Daisuke Koizumi, Yoshito Konno, Eiji Yoshida, Toshiyuki Honda +2 more | 2004-08-10 |
| 6767219 | Contactor, method for manufacturing such contactor, and testing method using such contactor | Shigeyuki Maruyama, Kazuhiro Tashiro, Naohito Kohashi, Osamu Igawa, Tetsuya Fujisawa | 2004-07-27 |