Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791345 | Contactor for testing semiconductor device and manufacturing method thereof | Shigeyuki Maruyama, Kazuhiro Tashiro, Naoyuki Watanabe, Daisuke Koizumi, Ei Yano | 2004-09-14 |