Issued Patents 2004
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6806723 | Contactor having contact electrodes formed by laser processing | Keisuke Fukuda, Naoyuki Watanabe, Takumi Kumatabara, Naohisa Matsushita, Masayuki Imakado +2 more | 2004-10-19 |
| 6791345 | Contactor for testing semiconductor device and manufacturing method thereof | Kazuhiro Tashiro, Naoyuki Watanabe, Daisuke Koizumi, Takafumi Hashitani, Ei Yano | 2004-09-14 |
| 6784657 | Handling apparatus and test set using the handling apparatus | Keiji Fujishiro, Yasunori Sato, Naohito Kohashi | 2004-08-31 |
| 6781395 | Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor | Futoshi Fukaya, Makoto Haseyama | 2004-08-24 |
| 6774650 | Probe card and method of testing wafer having a plurality of semiconductor devices | Daisuke Koizumi, Naoyuki Watanabe, Yoshito Konno, Eiji Yoshida, Toshiyuki Honda +2 more | 2004-08-10 |
| 6767219 | Contactor, method for manufacturing such contactor, and testing method using such contactor | Naoyuki Watanabe, Kazuhiro Tashiro, Naohito Kohashi, Osamu Igawa, Tetsuya Fujisawa | 2004-07-27 |
| 6762431 | Wafer-level package with test terminals | — | 2004-07-13 |
| 6696754 | Semiconductor module including a plurality of semiconductor devices detachably | Mitsutaka Sato, Tetsuya Fujisawa, Junichi Kasai, Toshimi Kawahara, Toshio Hamano +5 more | 2004-02-24 |